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Pattern-Based Peephole Optimizations with Java JIT Tests:

, In: Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis,
Zang, Zhiqiang ; Thimmaiah, Aditya ; Gligoric, Milos - p. 64-75 , 2023
Link: https://dl.acm.org/doi/10.1145/3597926.3598038