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Test Accuracy vs. Generalization Gap: Model Selection in NL..:

, In: Proceedings of the 29th ACM SIGKDD Conference on Knowledge Discovery and Data Mining,
Yang, Yaoqing ; Theisen, Ryan ; Hodgkinson, Liam... - p. 3011-3021 , 2023
Link: https://dl.acm.org/doi/10.1145/3580305.3599518