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1 Ergebnisse
1
A Few-shot Learning Method for the Defect Inspection of Lit..:
, In:
Proceedings of the 2023 4th International Conference on Computing, Networks and Internet of Things
,
Xu, Chuan
;
Ye, Yuping
;
Zhang, Jiankai
... - p. 983-989 , 2023
Link:
https://dl.acm.org/doi/10.1145/3603781.3604228
RT T1 <cTitle>Proceedings of the 2023 4th International Conference on Computing, Networks and Internet of Things</cTitle>: T1 <Title>A Few-shot Learning Method for the Defect Inspection of Lithium Battery Sealing Nails</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3604228&Exemplar=1&LAN=DE A1 Xu, Chuan A1 Ye, Yuping A1 Zhang, Jiankai A1 Song, Zhan A1 Zhao, Juan A1 Gu, Feifei PB ACM YR 2023 K1 Copy-Paste augmentation K1 sealing nails K1 semantic segmentation K1 Computing methodologies K1 Artificial intelligence K1 Computer vision K1 Computer vision tasks K1 Scene anomaly detection K1 Computer vision problems K1 Image segmentation K1 Computer vision representations K1 Appearance and texture representations SP 983 OP 989 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3603781.3604228 DO https://dl.acm.org/doi/10.1145/3603781.3604228 SF ELIB - SuUB Bremen
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