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A Robust Backward Compatibility Metric for Model Retraining:
, In:
Proceedings of the 32nd ACM International Conference on Information and Knowledge Management
,
Matsuno, Ryuta
;
Sakuma, Keita
- p. 4190-4194 , 2023
Link:
https://dl.acm.org/doi/10.1145/3583780.3615213
RT T1 <cTitle>Proceedings of the 32nd ACM International Conference on Information and Knowledge Management</cTitle>: T1 <Title>A Robust Backward Compatibility Metric for Model Retraining</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3615213&Exemplar=1&LAN=DE A1 Matsuno, Ryuta A1 Sakuma, Keita PB ACM YR 2023 K1 backward compatibility K1 degradation K1 machine learning K1 mlops K1 model retraining K1 Computing methodologies K1 Machine learning K1 Software and its engineering K1 Software organization and properties K1 Software functional properties K1 Correctness K1 Consistency K1 Software creation and management K1 Software post-development issues K1 Maintaining software SP 4190 OP 4194 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3583780.3615213 DO https://dl.acm.org/doi/10.1145/3583780.3615213 SF ELIB - SuUB Bremen
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