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1 Ergebnisse
1
Machine Learning Techniques for Escaped Defect Analysis in ..:
, In:
Proceedings of the 8th Brazilian Symposium on Systematic and Automated Software Testing
,
Nascimento, Lidia Perside Gomes
;
Prudêncio, Ricardo Bastos Cavalcante
;
Mota, Alexandre Cabral
... - p. 47-53 , 2023
Link:
https://dl.acm.org/doi/10.1145/3624032.3624039
RT T1
Proceedings of the 8th Brazilian Symposium on Systematic and Automated Software Testing
: T1
Machine Learning Techniques for Escaped Defect Analysis in Software Testing
UL https://suche.suub.uni-bremen.de/peid=acm-3624039&Exemplar=1&LAN=DE A1 Nascimento, Lidia Perside Gomes A1 Prudêncio, Ricardo Bastos Cavalcante A1 Mota, Alexandre Cabral A1 Filho, Audir de Araujo Paiva A1 Cruz, Pedro Henrique Alves A1 Oliveira, Daniel Cardoso Coelho Alves de A1 Moreira, Pedro Roncoli Sarmet PB ACM YR 2023 K1 Bug Reports K1 Escaped Defect Analysis K1 Machine Learning K1 Software and its engineering K1 Computing methodologies K1 Machine learning K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 47 OP 53 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3624032.3624039 DO https://dl.acm.org/doi/10.1145/3624032.3624039 SF ELIB - SuUB Bremen
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