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1
FITS: Inferring Intermediate Taint Sources for Effective Vu..:
, In:
Proceedings of the 28th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 4
,
Liu, Puzhuo
;
Zheng, Yaowen
;
Sun, Chengnian
... - p. 138-152 , 2023
Link:
https://dl.acm.org/doi/10.1145/3623278.3624759
RT T1 <cTitle>Proceedings of the 28th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 4</cTitle>: T1 <Title>FITS: Inferring Intermediate Taint Sources for Effective Vulnerability Analysis of IoT Device Firmware</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3624759&Exemplar=1&LAN=DE A1 Liu, Puzhuo A1 Zheng, Yaowen A1 Sun, Chengnian A1 Qin, Chuan A1 Fang, Dongliang A1 Liu, Mingdong A1 Sun, Limin PB ACM YR 2023 K1 firmware K1 taint analysis K1 vulnerability K1 Computer systems organization K1 Embedded and cyber-physical systems K1 Security and privacy K1 Systems security K1 Software and application security K1 Software security engineering K1 Software and its engineering K1 Software notations and tools SP 138 OP 152 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3623278.3624759 DO https://dl.acm.org/doi/10.1145/3623278.3624759 SF ELIB - SuUB Bremen
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