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Mask Defect Detection: A Journey through Real-World Applica..:

, In: Proceedings of the 2023 Asia Conference on Artificial Intelligence, Machine Learning and Robotics,
Ho, Cheng-Yuan ; Yang, Yong-Sheng - p. 1-5 , 2023
Link: https://dl.acm.org/doi/10.1145/3625343.3625345