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1 Ergebnisse
1
Recognizing Patterns in Productive Failure:
, In:
Proceedings of the 55th ACM Technical Symposium on Computer Science Education V. 1
,
Steinhorst, Phil
;
Duhme, Christof
;
Jiang, Xiaoyi
. - p. 1293-1299 , 2024
Link:
https://dl.acm.org/doi/10.1145/3626252.3630915
RT T1 <cTitle>Proceedings of the 55th ACM Technical Symposium on Computer Science Education V. 1</cTitle>: T1 <Title>Recognizing Patterns in Productive Failure</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3630915&Exemplar=1&LAN=DE A1 Steinhorst, Phil A1 Duhme, Christof A1 Jiang, Xiaoyi A1 Vahrenhold, Jan PB ACM YR 2024 K1 pattern recognition K1 problem-based learning K1 productive failure K1 Social and professional topics K1 Professional topics K1 Computing education SP 1293 OP 1299 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3626252.3630915 DO https://dl.acm.org/doi/10.1145/3626252.3630915 SF ELIB - SuUB Bremen
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