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1 Ergebnisse
1
Abnormal Analysis and Treatment of Voltage Test Data Based ..:
, In:
Proceedings of the 2023 International Conference on Big Data Mining and Information Processing
,
Xu, Hong-Wei
;
Wang, Yong
;
Yang, Xiao-Lu
. - p. 116-119 , 2023
Link:
https://dl.acm.org/doi/10.1145/3645279.3645300
RT T1 <cTitle>Proceedings of the 2023 International Conference on Big Data Mining and Information Processing</cTitle>: T1 <Title>Abnormal Analysis and Treatment of Voltage Test Data Based on Deep Learning</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3645300&Exemplar=1&LAN=DE A1 Xu, Hong-Wei A1 Wang, Yong A1 Yang, Xiao-Lu A1 Yang, Peng-Fei PB ACM YR 2023 K1 Anomaly Detection K1 Convolutional Neural Network K1 Deep Learning K1 Voltage Test Data K1 Computing methodologies K1 Machine learning K1 Machine learning approaches K1 Neural networks K1 Learning latent representations K1 Deep belief networks SP 116 OP 119 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3645279.3645300 DO https://dl.acm.org/doi/10.1145/3645279.3645300 SF ELIB - SuUB Bremen
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