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1 Ergebnisse
1
Detection of DC arc with statistical feature of high freque..:
, In:
Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering
,
Li, Gang
;
Wang, Xinyu
;
Mao, Lei
- p. 93-98 , 2023
Link:
https://dl.acm.org/doi/10.1145/3650400.3650416
RT T1
Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering
: T1
Detection of DC arc with statistical feature of high frequency current sample
UL https://suche.suub.uni-bremen.de/peid=acm-3650416&Exemplar=1&LAN=DE A1 Li, Gang A1 Wang, Xinyu A1 Mao, Lei PB ACM YR 2023 K1 Hardware K1 Hardware test K1 Fault models and test metrics SP 93 OP 98 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3650400.3650416 DO https://dl.acm.org/doi/10.1145/3650400.3650416 SF ELIB - SuUB Bremen
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