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1 Ergebnisse
1
A Deep Learning Method for PCB Defect Detection Based on Im..:
, In:
Proceedings of the International Conference on Computer Vision and Deep Learning
,
Zhu, Panke
;
Cai, Yiwen
;
Li, Fen
... - p. 1-7 , 2024
Link:
https://dl.acm.org/doi/10.1145/3653781.3653830
RT T1 <cTitle>Proceedings of the International Conference on Computer Vision and Deep Learning</cTitle>: T1 <Title>A Deep Learning Method for PCB Defect Detection Based on Improved Yolov8</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3653830&Exemplar=1&LAN=DE A1 Zhu, Panke A1 Cai, Yiwen A1 Li, Fen A1 Kan, Jing A1 Chen, Kewei A1 Dong, Fangyan PB ACM YR 2024 SP 1 OP 7 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3653781.3653830 DO https://dl.acm.org/doi/10.1145/3653781.3653830 SF ELIB - SuUB Bremen
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