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1 Ergebnisse
1
DETECTive: Machine Learning-driven Automatic Test Pattern P..:
, In:
Proceedings of the Great Lakes Symposium on VLSI 2024
,
Petrolo, Vincenzo
;
Medya, Sourav
;
Graziano, Mariagrazia
. - p. 32-37 , 2024
Link:
https://dl.acm.org/doi/10.1145/3649476.3658696
RT T1
Proceedings of the Great Lakes Symposium on VLSI 2024
: T1
DETECTive: Machine Learning-driven Automatic Test Pattern Prediction for Faults in Digital Circuits
UL https://suche.suub.uni-bremen.de/peid=acm-3658696&Exemplar=1&LAN=DE A1 Petrolo, Vincenzo A1 Medya, Sourav A1 Graziano, Mariagrazia A1 Pal, Debjit PB ACM YR 2024 K1 ATPG K1 Deep Learning K1 Graph Neural Networks K1 Hardware K1 Hardware test K1 Test-pattern generation and fault simulation SP 32 OP 37 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3649476.3658696 DO https://dl.acm.org/doi/10.1145/3649476.3658696 SF ELIB - SuUB Bremen
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