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1 Ergebnisse
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IDLD: Interlocked Dual-Circle Latch Design with Low Cost an..:
, In:
Proceedings of the Great Lakes Symposium on VLSI 2024
,
Yan, Aibin
;
Dong, Chen
;
Guo, Xing
... - p. 19-24 , 2024
Link:
https://dl.acm.org/doi/10.1145/3649476.3658761
RT T1 <cTitle>Proceedings of the Great Lakes Symposium on VLSI 2024</cTitle>: T1 <Title>IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3658761&Exemplar=1&LAN=DE A1 Yan, Aibin A1 Dong, Chen A1 Guo, Xing A1 Song, Jie A1 Cui, Jie A1 Ni, Tianming A1 Girard, Patrick A1 Wen, Xiaoqing PB ACM YR 2024 K1 Circuit reliability K1 radiation hardness K1 robust computing K1 soft error tolerance K1 Hardware K1 Robustness K1 Fault tolerance K1 Redundancy SP 19 OP 24 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3649476.3658761 DO https://dl.acm.org/doi/10.1145/3649476.3658761 SF ELIB - SuUB Bremen
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