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Applying expert system methods to SMD visual inspection:
, In:
Proceedings of the 2nd international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 2
,
Grant, E.
;
Shepherd, B. A.
- p. 900-907 , 1989
Link:
https://dl.acm.org/doi/10.1145/67312.67363
RT T1 <cTitle>Proceedings of the 2nd international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 2</cTitle>: T1 <Title>Applying expert system methods to SMD visual inspection</Title> UL https://suche.suub.uni-bremen.de/peid=acm-67363&Exemplar=1&LAN=DE A1 Grant, E. A1 Shepherd, B. A. PB ACM YR 1989 K1 Computing methodologies K1 Artificial intelligence K1 Computer vision K1 Social and professional topics K1 Professional topics K1 Computing and business K1 Automation K1 Applied computing K1 Operations research K1 Industry and manufacturing K1 Physical sciences and engineering K1 Electronics K1 Computer systems organization K1 Embedded and cyber-physical systems K1 Robotics K1 Robotic components SP 900 OP 907 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/67312.67363 DO https://dl.acm.org/doi/10.1145/67312.67363 SF ELIB - SuUB Bremen
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