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1 Ergebnisse
1
Test generation of stuck-open faults using stuck-at test se..:
, In:
Proceedings of the 26th ACM/IEEE Design Automation Conference
,
Lee, H. K.
;
Ha, D. S.
;
Kim, K.
- p. 345-350 , 1989
Link:
https://dl.acm.org/doi/10.1145/74382.74440
RT T1
Proceedings of the 26th ACM/IEEE Design Automation Conference
: T1
Test generation of stuck-open faults using stuck-at test sets in CMOS combinational circuits
UL https://suche.suub.uni-bremen.de/peid=acm-74440&Exemplar=1&LAN=DE A1 Lee, H. K. A1 Ha, D. S. A1 Kim, K. PB ACM YR 1989 K1 Hardware K1 Integrated circuits K1 Logic circuits K1 Combinational circuits K1 Robustness K1 Fault tolerance K1 Error detection and error correction K1 Hardware test K1 Test-pattern generation and fault simulation SP 345 OP 350 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/74382.74440 DO https://dl.acm.org/doi/10.1145/74382.74440 SF ELIB - SuUB Bremen
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