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1 Ergebnisse
1
A simplified six-waveform type method for delay fault testi..:
, In:
Proceedings of the 26th ACM/IEEE Design Automation Conference
,
Mao, W.-W.
;
Ciletti, M.D.
- p. 730-733 , 1989
Link:
https://dl.acm.org/doi/10.1145/74382.74515
RT T1 <cTitle>Proceedings of the 26th ACM/IEEE Design Automation Conference</cTitle>: T1 <Title>A simplified six-waveform type method for delay fault testing</Title> UL https://suche.suub.uni-bremen.de/peid=acm-74515&Exemplar=1&LAN=DE A1 Mao, W.-W. A1 Ciletti, M.D. PB ACM YR 1989 K1 Hardware K1 Very large scale integration design K1 Hardware test K1 Design for testability SP 730 OP 733 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/74382.74515 DO https://dl.acm.org/doi/10.1145/74382.74515 SF ELIB - SuUB Bremen
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