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1 Ergebnisse
1
Theoretical and practical validation of combined BEM/FEM su..:
, In:
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
,
Schrik, E.
;
Dewilde, P. M.
;
van der Meijs, N. P.
- p. 10-15 , 2002
Link:
https://dl.acm.org/doi/10.1145/774572.774574
RT T1
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
: T1
Theoretical and practical validation of combined BEM/FEM substrate resistance modeling
UL https://suche.suub.uni-bremen.de/peid=acm-774574&Exemplar=1&LAN=DE A1 Schrik, E. A1 Dewilde, P. M. A1 van der Meijs, N. P. PB ACM YR 2002 K1 Hardware K1 Communication hardware, interfaces and storage K1 Signal processing systems K1 Robustness K1 Hardware reliability K1 Signal integrity and noise analysis K1 Networks K1 Network types K1 Wired access networks K1 Integrated circuits K1 Applied computing K1 Physical sciences and engineering K1 Electronics SP 10 OP 15 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/774572.774574 DO https://dl.acm.org/doi/10.1145/774572.774574 SF ELIB - SuUB Bremen
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