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1 Ergebnisse
1
Complexity of sequential ATPG:
, In:
Proceedings of the 1995 European conference on Design and Test
,
Marchok, T. E.
;
El-Maleh, A.
;
Maly, W.
. - p. 252 ff. , 1995
Link:
https://dl.acm.org/doi/10.5555/787258.787447
RT T1 <cTitle>Proceedings of the 1995 European conference on Design and Test</cTitle>: T1 <Title>Complexity of sequential ATPG</Title> UL https://suche.suub.uni-bremen.de/peid=acm-787447&Exemplar=1&LAN=DE A1 Marchok, T. E. A1 El-Maleh, A. A1 Maly, W. A1 Rajski, J. PB IEEE Computer Society YR 1995 K1 VLSI K1 automatic test pattern generation K1 automatic testing K1 circuit attribute K1 density of encoding K1 design for testability K1 integrated circuit testing K1 logic testing K1 retiming transformation K1 sequential ATPG K1 sequential circuits K1 structural ATPG K1 test generation times K1 testing complexity K1 timing K1 Hardware K1 Hardware test K1 Robustness SP 252 ff. LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/787258.787447 DO https://dl.acm.org/doi/10.5555/787258.787447 SF ELIB - SuUB Bremen
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