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1 Ergebnisse
1
A scheme for multiple on-chip signature checking for embedd..:
, In:
Proceedings of the 1997 European conference on Design and Test
,
Abdulla, M. F.
;
Ravikumar, C. P.
;
Kumar, A.
- p. 625 ff. , 1997
Link:
https://dl.acm.org/doi/10.5555/787260.787730
RT T1
Proceedings of the 1997 European conference on Design and Test
: T1
A scheme for multiple on-chip signature checking for embedded SRAMs
UL https://suche.suub.uni-bremen.de/peid=acm-787730&Exemplar=1&LAN=DE A1 Abdulla, M. F. A1 Ravikumar, C. P. A1 Kumar, A. PB IEEE Computer Society YR 1997 K1 ASIC K1 BIST K1 built-in self test K1 embedded SRAM K1 multiple on-chip signature checking K1 pseudorandom self testing K1 telecommunications circuit K1 Networks K1 Network performance evaluation K1 Computer systems organization K1 Dependable and fault-tolerant systems and networks K1 Hardware K1 Hardware test K1 Robustness K1 General and reference K1 Cross-computing tools and techniques K1 Performance K1 Integrated circuits K1 Semiconductor memory SP 625 ff. LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/787260.787730 DO https://dl.acm.org/doi/10.5555/787260.787730 SF ELIB - SuUB Bremen
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