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1 Ergebnisse
1
On fault detection in CMOS logic networks:
, In:
Proceedings of the 20th Design Automation Conference
,
Chiang, Kuang-Wei
;
Vranesic, Zvonko G.
- p. 50-56 , 1983
Link:
https://dl.acm.org/doi/10.5555/800032.800640
RT T1 <cTitle>Proceedings of the 20th Design Automation Conference</cTitle>: T1 <Title>On fault detection in CMOS logic networks</Title> UL https://suche.suub.uni-bremen.de/peid=acm-800640&Exemplar=1&LAN=DE A1 Chiang, Kuang-Wei A1 Vranesic, Zvonko G. PB IEEE Press YR 1983 K1 CMOS circuits K1 Fault detection K1 Test generation K1 Hardware K1 Hardware test K1 Robustness K1 Emerging technologies K1 Very large scale integration design SP 50 OP 56 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/800032.800640 DO https://dl.acm.org/doi/10.5555/800032.800640 SF ELIB - SuUB Bremen
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