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1 Ergebnisse
1
On the reliability of the CDP and CCP examinations:
, In:
Proceedings of the ACM '82 conference
,
Ketchel, James S.
- p. 223-228 , 1982
Link:
https://dl.acm.org/doi/10.1145/800174.809813
RT T1 <cTitle>Proceedings of the ACM '82 conference</cTitle>: T1 <Title>On the reliability of the CDP and CCP examinations</Title> UL https://suche.suub.uni-bremen.de/peid=acm-809813&Exemplar=1&LAN=DE A1 Ketchel, James S. PB ACM YR 1982 K1 Social and professional topics K1 Professional topics K1 Computing profession K1 Testing, certification and licensing SP 223 OP 228 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/800174.809813 DO https://dl.acm.org/doi/10.1145/800174.809813 SF ELIB - SuUB Bremen
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