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1
Investigating the frequency dependence elements of CMOS RFI..:
, In:
Proceedings of the 2004 international workshop on System level interconnect prediction
,
Ong, B. H.
;
Sia, C. B.
;
Yeo, K. S.
... - p. 31-38 , 2004
Link:
https://dl.acm.org/doi/10.1145/966747.966754
RT T1
Proceedings of the 2004 international workshop on System level interconnect prediction
: T1
Investigating the frequency dependence elements of CMOS RFIC interconnects for physical modeling
UL https://suche.suub.uni-bremen.de/peid=acm-966754&Exemplar=1&LAN=DE A1 Ong, B. H. A1 Sia, C. B. A1 Yeo, K. S. A1 Ma, J. G. A1 Do, M. A. A1 Li, E. P. PB ACM YR 2004 K1 distributed effects K1 frequency dependence elements K1 physical model K1 skin effects K1 Hardware K1 Electronic design automation K1 Physical design (EDA) K1 Partitioning and floorplanning K1 Hardware validation K1 Functional verification SP 31 OP 38 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/966747.966754 DO https://dl.acm.org/doi/10.1145/966747.966754 SF ELIB - SuUB Bremen
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