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1 Ergebnisse
1
Parametric yield estimation considering leakage variability:
, In:
Proceedings of the 41st annual Design Automation Conference
,
Rao, Rajeev R.
;
Devgan, Anirudh
;
Blaauw, David
. - p. 442-447 , 2004
Link:
https://dl.acm.org/doi/10.1145/996566.996693
RT T1 <cTitle>Proceedings of the 41st annual Design Automation Conference</cTitle>: T1 <Title>Parametric yield estimation considering leakage variability</Title> UL https://suche.suub.uni-bremen.de/peid=acm-996693&Exemplar=1&LAN=DE A1 Rao, Rajeev R. A1 Devgan, Anirudh A1 Blaauw, David A1 Sylvester, Dennis PB ACM YR 2004 K1 leakage K1 parametric yield K1 variability K1 Hardware K1 Hardware validation SP 442 OP 447 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/996566.996693 DO https://dl.acm.org/doi/10.1145/996566.996693 SF ELIB - SuUB Bremen
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