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1 Ergebnisse
1
Combining dictionary coding and LFSR reseeding for test dat..:
, In:
Proceedings of the 41st annual Design Automation Conference
,
Sun, Xiaoyun
;
Kinney, Larry
;
Vinnakota, Bapiraju
- p. 944-947 , 2004
Link:
https://dl.acm.org/doi/10.1145/996566.996816
RT T1 <cTitle>Proceedings of the 41st annual Design Automation Conference</cTitle>: T1 <Title>Combining dictionary coding and LFSR reseeding for test data compression</Title> UL https://suche.suub.uni-bremen.de/peid=acm-996816&Exemplar=1&LAN=DE A1 Sun, Xiaoyun A1 Kinney, Larry A1 Vinnakota, Bapiraju PB ACM YR 2004 K1 VLSI test K1 built-In self test K1 Hardware K1 Hardware test K1 Robustness SP 944 OP 947 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/996566.996816 DO https://dl.acm.org/doi/10.1145/996566.996816 SF ELIB - SuUB Bremen
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