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1 Ergebnisse
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Optical Characterization of PtSi/Si by Spectroscopic Ellips..:
Le, Van Long
;
Kim, Tae Jung
;
Park, Han Gyeol
...
http://arxiv.org/abs/1606.03767. , 2016
Link:
http://arxiv.org/abs/1606.03767
RT Journal T1
Optical Characterization of PtSi/Si by Spectroscopic Ellipsometry
UL https://suche.suub.uni-bremen.de/peid=base-ftarxivpreprints:oai:arXiv.org:1606.03767&Exemplar=1&LAN=DE A1 Le, Van Long A1 Kim, Tae Jung A1 Park, Han Gyeol A1 Kim, Hwa Seob A1 Yoo, Chang Hyun A1 Kim, Hyoung Uk A1 Kim, Young Dong A1 Kim, Junsoo A1 Im, Solyee A1 Choi, Won Chul A1 Moon, Seung Eon A1 and, Eun Soo Nam YR 2016 K1 Condensed Matter - Materials Science JF http://arxiv.org/abs/1606.03767 LK http://arxiv.org/abs/1606.03767 DO http://arxiv.org/abs/1606.03767 SF ELIB - SuUB Bremen
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