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1 Ergebnisse
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On a critical artifact in the quantum yield methodology:
van Dam, Bart
;
Bruhn, Benjamin
;
Kondapaneni, Ivo
...
http://arxiv.org/abs/1808.00779. , 2018
Link:
http://arxiv.org/abs/1808.00779
RT Journal T1
On a critical artifact in the quantum yield methodology
UL https://suche.suub.uni-bremen.de/peid=base-ftarxivpreprints:oai:arXiv.org:1808.00779&Exemplar=1&LAN=DE A1 van Dam, Bart A1 Bruhn, Benjamin A1 Kondapaneni, Ivo A1 Dohnal, Gejza A1 Wilkie, Alexander A1 Křivánek, Jaroslav A1 Valenta, Jan A1 Mudde, Yvo A1 Schall, Peter A1 Dohnalová, Kateřina YR 2018 K1 Physics - Applied Physics K1 Physics - Optics JF http://arxiv.org/abs/1808.00779 LK http://arxiv.org/abs/1808.00779 DO http://arxiv.org/abs/1808.00779 SF ELIB - SuUB Bremen
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