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1 Ergebnisse
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Cryogenic Characterization of 180 nm CMOS Technology at 100..:
Huang, Roger
;
Gnani, Dario
;
Grace, Carl
...
http://arxiv.org/abs/2003.00207. , 2020
Link:
http://arxiv.org/abs/2003.00207
RT Journal T1
Cryogenic Characterization of 180 nm CMOS Technology at 100 mK
UL https://suche.suub.uni-bremen.de/peid=base-ftarxivpreprints:oai:arXiv.org:2003.00207&Exemplar=1&LAN=DE A1 Huang, Roger A1 Gnani, Dario A1 Grace, Carl A1 Kolomensky, Yury A1 Mei, Yuan A1 Papadopoulou, Aikaterini YR 2020 K1 Physics - Instrumentation and Detectors JF http://arxiv.org/abs/2003.00207 LK http://arxiv.org/abs/2003.00207 DO http://arxiv.org/abs/2003.00207 SF ELIB - SuUB Bremen
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