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1 Ergebnisse
1
Negative Capacitance Enables FinFET Scaling Beyond 3nm Node:
Kao, Ming-Yen
;
Agarwal, Harshit
;
Liao, Yu-Hung
...
http://arxiv.org/abs/2007.14448. , 2020
Link:
http://arxiv.org/abs/2007.14448
RT Journal T1
Negative Capacitance Enables FinFET Scaling Beyond 3nm Node
UL https://suche.suub.uni-bremen.de/peid=base-ftarxivpreprints:oai:arXiv.org:2007.14448&Exemplar=1&LAN=DE A1 Kao, Ming-Yen A1 Agarwal, Harshit A1 Liao, Yu-Hung A1 Cheema, Suraj A1 Dasgupta, Avirup A1 Kushwaha, Pragya A1 Tan, Ava A1 Salahuddin, Sayeef A1 Hu, Chenming YR 2020 K1 Physics - Applied Physics JF http://arxiv.org/abs/2007.14448 LK http://arxiv.org/abs/2007.14448 DO http://arxiv.org/abs/2007.14448 SF ELIB - SuUB Bremen
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