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1 Ergebnisse
1
Tomographic diffractive microscopy and multiview profilomet..:
Liu, Hui
;
Bailleul, Jonathan
;
Simon, Bertrand
...
info:eu-repo/semantics/altIdentifier/doi/10.1364/AO.53.000748. , 2013
Link:
https://hal.science/hal-00998064
RT Journal T1
Tomographic diffractive microscopy and multiview profilometry with flexible aberration correction
UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-00998064v1&Exemplar=1&LAN=DE A1 Liu, Hui A1 Bailleul, Jonathan A1 Simon, Bertrand A1 Debailleul, Matthieu A1 Colicchio, Bruno A1 Haeberlé, Olivier PB HAL CCSD; Optical Society of America YR 2013 K1 Holography K1 Aberration compensation K1 Superresolution K1 Tomographic imaging K1 Fourier optics and signal processing K1 OCIS K1 [SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing K1 [INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing JF info:eu-repo/semantics/altIdentifier/doi/10.1364/AO.53.000748 LK http://dx.doi.org/https://hal.science/hal-00998064 DO https://hal.science/hal-00998064 SF ELIB - SuUB Bremen
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