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Defects Investigation in Nanosecond laser Annealed Crystall..:
Monflier, Richard
;
Rizk, Hiba
;
Tabata, Toshiyuki
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IIT.2018.8807933. , 2018
Link:
https://hal.laas.fr/hal-01803955
RT Journal T1 <Title>Defects Investigation in Nanosecond laser Annealed Crystalline Silicon: Identification and Localization</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-01803955v2&Exemplar=1&LAN=DE A1 Monflier, Richard A1 Rizk, Hiba A1 Tabata, Toshiyuki A1 Roul, Julien A1 Boninelli, Simona A1 Italia, Markus A1 Magna, Antonio A1 Mazzamuto, Fulvio A1 Acosta, Pablo A1 Kerdilès, S A1 Cristiano, Fuccio A1 Bedel-Pereira, Eléna PB HAL CCSD YR 2018 K1 melt laser annealing K1 defects K1 photoluminescence K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IIT.2018.8807933 LK http://dx.doi.org/https://hal.laas.fr/hal-01803955 DO https://hal.laas.fr/hal-01803955 SF ELIB - SuUB Bremen
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