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1 Ergebnisse
1
SIMS Analyses Applied to Open an Optical Window in 4H-SiC D..:
Lazar, Mihai
;
Jomard, François
;
Nguyen, Duy Minh
...
info:eu-repo/semantics/altIdentifier/doi/10.4028/www.scientific.net/MSF.717-720.885. , 2012
Link:
https://hal.archives-ouvertes.fr/hal-02166414
RT Journal T1 <Title>SIMS Analyses Applied to Open an Optical Window in 4H-SiC Devices for Electro-Optical Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-02166414v1&Exemplar=1&LAN=DE A1 Lazar, Mihai A1 Jomard, François A1 Nguyen, Duy Minh A1 Raynaud, Christophe A1 Pâques, Gontran A1 Scharnholz, Sigo A1 Tournier, Dominique A1 Planson, Dominique PB HAL CCSD; Trans Tech Publications Inc. YR 2012 K1 bipolar diode K1 4H-SiC K1 SIMS K1 OBIC K1 optical window K1 impact ionization coefficients K1 [SPI.NRJ]Engineering Sciences [physics]/Electric power JF info:eu-repo/semantics/altIdentifier/doi/10.4028/www.scientific.net/MSF.717-720.885 LK http://dx.doi.org/https://hal.archives-ouvertes.fr/hal-02166414 DO https://hal.archives-ouvertes.fr/hal-02166414 SF ELIB - SuUB Bremen
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