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1 Ergebnisse
1
Innovative Practices Track: Innovative Analog Circuit Testi..:
Mangelsdorf, Chris
;
Madhvaraj, Manasa
;
Mir, Salvador
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS52500.2021.9794191. , 2022
Link:
https://hal.science/hal-03759565
RT Journal T1
Innovative Practices Track: Innovative Analog Circuit Testing Technologies
UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-03759565v1&Exemplar=1&LAN=DE A1 Mangelsdorf, Chris A1 Madhvaraj, Manasa A1 Mir, Salvador A1 Barragan, Manuel A1 Limori, Daisuke A1 Nakatani, Takayuki A1 Katayama, Shogo A1 Ogihara, Gaku A1 Zhao, Yujie A1 Wei, Jianglin A1 Kuwana, Anna A1 Kentaroh, Katoh A1 Hatayama, Kazumi A1 Kobayashi, Haruo A1 Sato, Keno A1 Ishida, Takashi A1 Okamoto, Toshiyuki A1 Ichikawa, Tamotsu PB HAL CCSD YR 2022 K1 analog and RF circuit K1 Design-for-Test (DfT) K1 ADC Testing K1 Jitter K1 On-chip Measurement K1 Self-Referenced Measurement K1 FD-SOI Technology K1 Electric Motive Force K1 Thermal Effects K1 DC-AC Conversion K1 High Precision Measurement K1 PACS 85.42 K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS52500.2021.9794191 LK http://dx.doi.org/https://hal.science/hal-03759565 DO https://hal.science/hal-03759565 SF ELIB - SuUB Bremen
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