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1 Ergebnisse
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Modelling of charge injection by multi-photon absorption in..:
Ngom, C
;
Pouget, Vincent
;
Zerarka, M
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114339. , 2021
Link:
https://hal.science/hal-03766631
RT Journal T1 <Title>Modelling of charge injection by multi-photon absorption in GaN-on-Si HEMTs for SEE testing</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-03766631v1&Exemplar=1&LAN=DE A1 Ngom, C A1 Pouget, Vincent A1 Zerarka, M A1 Coccetti, F A1 Crepel, O A1 Touboul, A A1 Matmat, M PB HAL CCSD; Elsevier YR 2021 K1 Laser testing K1 Modelling K1 GaN HEMT K1 Radiation effects K1 Single event effects K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics K1 [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114339 LK http://dx.doi.org/https://hal.science/hal-03766631 DO https://hal.science/hal-03766631 SF ELIB - SuUB Bremen
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