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1 Ergebnisse
1
Hybridization of ellipsometry and Xps energy loss: robust b..:
Levert, Théo
;
Zakhtser, Alter
;
Duval, Julien
...
info:eu-repo/semantics/altIdentifier/doi/10.2139/ssrn.4554544. , 2023
Link:
https://hal.science/hal-04253891
RT Journal T1
Hybridization of ellipsometry and Xps energy loss: robust band gap and broadband optical constants determination of SiGe, HfON and MoOx thin films
UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-04253891v1&Exemplar=1&LAN=DE A1 Levert, Théo A1 Zakhtser, Alter A1 Duval, Julien A1 Raguenez, Chloé A1 Verdier, Stéphane A1 Le Cunff, Delphine A1 Tortai, Jean-Hervé A1 Pelissier, Bernard PB HAL CCSD; Elsevier YR 2023 K1 XPS K1 Ellipsometry K1 Bandgap K1 Optical Constants K1 Microelectronics K1 Metrology K1 [PHYS]Physics [physics] JF info:eu-repo/semantics/altIdentifier/doi/10.2139/ssrn.4554544 LK http://dx.doi.org/https://hal.science/hal-04253891 DO https://hal.science/hal-04253891 SF ELIB - SuUB Bremen
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