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1 Ergebnisse
1
Failure Degradation Similarities on Power SiC MOSFET Device..:
Oliveira, Joao
;
Frey, Pascal
;
Morel, Hervé
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2023.115166. , 2023
Link:
https://hal.science/hal-04316701
RT Journal T1 <Title>Failure Degradation Similarities on Power SiC MOSFET Devices Submitted to Short-Circuit Stress and Accelerated Switching Conditions</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-04316701v1&Exemplar=1&LAN=DE A1 Oliveira, Joao A1 Frey, Pascal A1 Morel, Hervé A1 Reynes, Jean-Michel A1 Burky, Jérémie A1 Coccetti, Fabio A1 Iannuzzo, Francesco A1 Piton, Michel PB HAL CCSD; Elsevier YR 2023 K1 [SPI.TRON]Engineering Sciences [physics]/Electronics JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2023.115166 LK http://dx.doi.org/https://hal.science/hal-04316701 DO https://hal.science/hal-04316701 SF ELIB - SuUB Bremen
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