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1 Ergebnisse
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Investigation of the reliability of nano-nickel/niobium oxi..:
Sahay, Rahul
;
Tu, Yen-Cheng
;
Aziz, Izzat
...
info:eu-repo/semantics/altIdentifier/doi/10.1039/d3ma00147d. , 2023
Link:
https://hal.science/hal-04418675
RT Journal T1 <Title>Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:hal-04418675v1&Exemplar=1&LAN=DE A1 Sahay, Rahul A1 Tu, Yen-Cheng A1 Aziz, Izzat A1 Budiman, Arief, S A1 Tan, Cher, Ming A1 Lee, Pooi, See A1 Thomas, Olivier A1 Raghavan, Nagarajan PB HAL CCSD; Royal Society of Chemistry YR 2023 K1 Flexible electronics K1 [PHYS]Physics [physics] JF info:eu-repo/semantics/altIdentifier/doi/10.1039/d3ma00147d LK http://dx.doi.org/https://hal.science/hal-04418675 DO https://hal.science/hal-04418675 SF ELIB - SuUB Bremen
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