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1
Influence de la température sur la vitesse limite des trous..:
Gamboa, M
;
Phan Pham, T
;
Tranduc, Henri
.
info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:019810016010059700. , 1981
Link:
https://hal.archives-ouvertes.fr/jpa-00244952
RT Journal T1
Influence de la température sur la vitesse limite des trous dans un transistor MOS à canal court de type P
UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:jpa-00244952v1&Exemplar=1&LAN=DE A1 Gamboa, M A1 Phan Pham, T A1 Tranduc, Henri A1 Rossel, P PB HAL CCSD; Société française de physique / EDP YR 1981 K1 insulated gate field effect transistors K1 hole saturation velocity K1 short channel MOS transistor K1 temperature dependence K1 carriers nature K1 crystal orientation K1 [PHYS.HIST]Physics [physics]/Physics archives JF info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:019810016010059700 LK http://dx.doi.org/https://hal.archives-ouvertes.fr/jpa-00244952 DO https://hal.archives-ouvertes.fr/jpa-00244952 SF ELIB - SuUB Bremen
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