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1
Silicium polycristallin:
Equer, Bernard
;
Pinard, Pierre
;
Rocher, André
.
info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:01987002207051100. , 1987
Link:
https://hal.archives-ouvertes.fr/jpa-00245567
RT Journal T1 <Title>Silicium polycristallin</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:jpa-00245567v1&Exemplar=1&LAN=DE A1 Equer, Bernard A1 Pinard, Pierre A1 Rocher, André A1 Rodot, Michel PB HAL CCSD; Société française de physique / EDP YR 1987 K1 Experimental study K1 Crystallization K1 Polycrystal K1 Bicrystal K1 Grain boundary K1 Defect level K1 Electrical properties K1 Impurity K1 Passivation K1 Semiconductor materials K1 Solar cell K1 Photovoltaic effect K1 Transmission electron microscopy K1 Microstructure K1 Deep level transient spectrometry K1 Silicon K1 Condensed matter physics K1 Materials science K1 Physics K1 [PHYS.HIST]Physics [physics]/Physics archives JF info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:01987002207051100 LK http://dx.doi.org/https://hal.archives-ouvertes.fr/jpa-00245567 DO https://hal.archives-ouvertes.fr/jpa-00245567 SF ELIB - SuUB Bremen
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