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1 Ergebnisse
1
Etude des structures MIS sur InP réalisées avec une double ..:
Jalaguier, E
;
Joseph, J
;
Robach, Y
..
info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:01987002208088500. , 1987
Link:
https://hal.archives-ouvertes.fr/jpa-00245628
RT Journal T1
Etude des structures MIS sur InP réalisées avec une double couche anodique
UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:jpa-00245628v1&Exemplar=1&LAN=DE A1 Jalaguier, E A1 Joseph, J A1 Robach, Y A1 Bergignat, E A1 Hollinger, G PB HAL CCSD; Société française de physique / EDP YR 1987 K1 anodised layers K1 III V semiconductors K1 indium compounds K1 metal insulator semiconductor structures K1 X ray photoelectron spectra K1 semiconductor K1 native oxide K1 MISFET K1 capacitance voltage measurements K1 MIS structures K1 anodic double layers K1 gate insulator K1 chemical composition K1 ellipsometry K1 XPS K1 electrical properties K1 interface K1 InP In PO sub 3 sub 3 Al sub 2 O sub 3 K1 [PHYS.HIST]Physics [physics]/Physics archives JF info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:01987002208088500 LK http://dx.doi.org/https://hal.archives-ouvertes.fr/jpa-00245628 DO https://hal.archives-ouvertes.fr/jpa-00245628 SF ELIB - SuUB Bremen
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