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1 Ergebnisse
1
Cross-Layer Early Reliability Evaluation: Challenges and Pr..:
Di Carlo, Stefano
;
Vallero, Alessandro
;
Gizopoulos, Dimitris
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IOLTS.2014.6873704. , 2014
Link:
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234123
RT Journal T1
Cross-Layer Early Reliability Evaluation: Challenges and Promises
UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:lirmm-01234123v1&Exemplar=1&LAN=DE A1 Di Carlo, Stefano A1 Vallero, Alessandro A1 Gizopoulos, Dimitris A1 Di Natale, Giorgio A1 Gonzales, Antonio A1 Canal, Ramon A1 Mariani, Riccardo A1 Pipponzi, Mauro A1 Grasset, Arnaud A1 Bonnot, Philippe A1 Reichenback, Frank A1 Rafiw, Gulzaib A1 Loekstad, Trond PB HAL CCSD; IEEE YR 2014 K1 Testing K1 Reliability evalution K1 Electronic engineering computing K1 Reliability K1 Computing systems K1 Cross-layer early reliability evaluation K1 Design cycle K1 Fault protection mechanisms K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IOLTS.2014.6873704 LK http://dx.doi.org/https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234123 DO https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234123 SF ELIB - SuUB Bremen
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