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1 Ergebnisse
1
Designs of Two Quadruple-Node-Upset Self-Recoverable Latche..:
Yan, Aibin
;
Li, Zhixing
;
Cui, Jie
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TAES.2022.3219372. , 2023
Link:
https://hal-lirmm.ccsd.cnrs.fr/lirmm-04236216
RT Journal T1 <Title>Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftccsdartic:oai:HAL:lirmm-04236216v1&Exemplar=1&LAN=DE A1 Yan, Aibin A1 Li, Zhixing A1 Cui, Jie A1 Huang, Zhengfeng A1 Ni, Tianming A1 Girard, Patrick A1 Wen, Xiaoqing PB HAL CCSD; Institute of Electrical and Electronics Engineers YR 2023 K1 Circuit reliability K1 latch design K1 Quadruple Node Upset (QNU) K1 Radiation-hardening K1 Soft-error K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/TAES.2022.3219372 LK http://dx.doi.org/https://hal-lirmm.ccsd.cnrs.fr/lirmm-04236216 DO https://hal-lirmm.ccsd.cnrs.fr/lirmm-04236216 SF ELIB - SuUB Bremen
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