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Surface slope metrology of highly curved x-ray optics with ..:
Gevorkyan, Gevork S
;
Centers, Gary
;
Polonska, Kateryna S
...
qt1sm4t2w6. , 2017
Link:
https://escholarship.org/uc/item/1sm4t2w6
RT Journal T1
Surface slope metrology of highly curved x-ray optics with an interferometric microscope
UL https://suche.suub.uni-bremen.de/peid=base-ftcdlib:oai:escholarship.org:ark:_13030_qt1sm4t2w6&Exemplar=1&LAN=DE A1 Gevorkyan, Gevork S A1 Centers, Gary A1 Polonska, Kateryna S A1 Nikitin, Sergey M A1 Lacey, Ian A1 Yashchuk, Valeriy V PB eScholarship, University of California YR 2017 K1 Manufacturing Engineering K1 Engineering K1 x-ray optics K1 high curvature mirrors K1 optical metrology K1 precision surface measurements K1 interferometric microscopy K1 calibration K1 residual slope variation K1 Communications engineering K1 Electronics K1 sensors and digital hardware K1 Atomic K1 molecular and optical physics JF qt1sm4t2w6 LK http://dx.doi.org/https://escholarship.org/uc/item/1sm4t2w6 DO https://escholarship.org/uc/item/1sm4t2w6 SF ELIB - SuUB Bremen
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