I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Cross comparison of surface slope and height optical metrol..:
Artemiev, Nikolay
qt57b6f4k4. , 2012
Link:
https://escholarship.org/uc/item/57b6f4k4
RT Journal T1
Cross comparison of surface slope and height optical metrology with a super-polished plane Si mirror
UL https://suche.suub.uni-bremen.de/peid=base-ftcdlib:oai:escholarship.org:ark:_13030_qt57b6f4k4&Exemplar=1&LAN=DE A1 Artemiev, Nikolay PB eScholarship, University of California YR 2012 K1 Instrumentation -- other K1 X-ray optics K1 synchrotron radiation K1 metrology of X-ray optics K1 long trace profiler K1 optical interferometry K1 super-polished flat X-ray mirror K1 optical metrology K1 wave-front preserving optics JF qt57b6f4k4 LK http://dx.doi.org/https://escholarship.org/uc/item/57b6f4k4 DO https://escholarship.org/uc/item/57b6f4k4 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)