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The developmental long trace profiler (DLTP) optimized for ..:
Lacey, Ian
;
Artemiev, Nikolay A
;
Domning, Edward E
...
qt6kq6v843. , 2014
Link:
https://escholarship.org/uc/item/6kq6v843
RT Journal T1
The developmental long trace profiler (DLTP) optimized for metrology of side-facing optics at the ALS
UL https://suche.suub.uni-bremen.de/peid=base-ftcdlib:oai:escholarship.org:ark:_13030_qt6kq6v843&Exemplar=1&LAN=DE A1 Lacey, Ian A1 Artemiev, Nikolay A A1 Domning, Edward E A1 McKinney, Wayne R A1 Morrison, Gregory Y A1 Morton, Simon A A1 Smith, Brian V A1 Yashchuk, Valeriy V PB eScholarship, University of California YR 2014 K1 Surface Metrology K1 long trace profiler K1 surface slope measurement K1 x-ray optics K1 large measurement range K1 accuracy K1 stability K1 nanoradian repeatability K1 synchrotron radiation JF qt6kq6v843 LK http://dx.doi.org/https://escholarship.org/uc/item/6kq6v843 DO https://escholarship.org/uc/item/6kq6v843 SF ELIB - SuUB Bremen
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