I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
The ALS OSMS: Optical Surface Measuring System for high acc..:
Lacey, Ian
;
Anderson, Kevan
;
Centers, Gary P
...
qt8560v7c3. , 2018
Link:
https://escholarship.org/uc/item/8560v7c3
RT Journal T1
The ALS OSMS: Optical Surface Measuring System for high accuracy two-dimensional slope metrology with state-of-the-art x-ray mirrors
UL https://suche.suub.uni-bremen.de/peid=base-ftcdlib:oai:escholarship.org:ark:_13030_qt8560v7c3&Exemplar=1&LAN=DE A1 Lacey, Ian A1 Anderson, Kevan A1 Centers, Gary P A1 Geckeler, Ralf D A1 Gevorkyan, Gevork A1 Grossiord, John A1 Just, Andreas A1 Nicolot, Theo A1 Smith, Brian V A1 Yashchuk, Valeriy V PB eScholarship, University of California YR 2018 K1 Data Management and Data Science K1 Information and Computing Sciences K1 Engineering K1 Physical Sciences K1 Synchrotron radiation K1 error suppression K1 wave-front preservation K1 calibration K1 metrology of x-ray optics K1 surface metrology K1 DLSR K1 FEL K1 Communications engineering K1 Electronics K1 sensors and digital hardware K1 Atomic K1 molecular and optical physics JF qt8560v7c3 LK http://dx.doi.org/https://escholarship.org/uc/item/8560v7c3 DO https://escholarship.org/uc/item/8560v7c3 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)