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1 Ergebnisse
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Investigation of resistance fluctuations in ReRAM: physical..:
Reganaz, Lucas
;
Deleruyelle, Damien
;
Rafhay, Quentin
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48203.2023.10117882. , 2023
Link:
https://cea.hal.science/cea-04169237
RT Journal T1
Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability
UL https://suche.suub.uni-bremen.de/peid=base-ftceafr:oai:HAL:cea-04169237v1&Exemplar=1&LAN=DE A1 Reganaz, Lucas A1 Deleruyelle, Damien A1 Rafhay, Quentin A1 Minguet Lopez, Joel A1 Castellani, Niccolo A1 Nodin, Jean-François A1 Bricalli, Alessandro A1 Piccolboni, Giuseppe A1 Molas, Gabriel A1 Andrieu, François PB HAL CCSD YR 2023 K1 [SPI.TRON]Engineering Sciences [physics]/Electronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48203.2023.10117882 LK http://dx.doi.org/https://cea.hal.science/cea-04169237 DO https://cea.hal.science/cea-04169237 SF ELIB - SuUB Bremen
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