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1 Ergebnisse
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Charge transfers and charged defects in WSe 2 /graphene-SiC..:
Dappe, Y
;
Almadori, Y
;
Dau, M
...
info:eu-repo/semantics/altIdentifier/doi/10.1088/1361-6528/ab8083. , 2020
Link:
https://hal.science/hal-02989896
RT Journal T1 <Title>Charge transfers and charged defects in WSe 2 /graphene-SiC interfaces</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftceafr:oai:HAL:hal-02989896v1&Exemplar=1&LAN=DE A1 Dappe, Y A1 Almadori, Y A1 Dau, M A1 Vergnaud, C A1 Jamet, M A1 Paillet, C A1 Journot, T A1 Hyot, B A1 Pochet, P A1 Grevin, Benjamin PB HAL CCSD; Institute of Physics YR 2020 K1 non-contact atomic force microscopy K1 Kelvin probe force microscopy K1 transition metal dichalcogenide K1 van der Waals heterostructures K1 graphene K1 charge transfer K1 Schottky-Mott model K1 charge defect K1 [PHYS]Physics [physics] JF info:eu-repo/semantics/altIdentifier/doi/10.1088/1361-6528/ab8083 LK http://dx.doi.org/https://hal.science/hal-02989896 DO https://hal.science/hal-02989896 SF ELIB - SuUB Bremen
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