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1 Ergebnisse
1
On the minimum thickness of doped Electron/Hole Transport L..:
Oussalah, D
;
Clerc, R
;
Baylet, J
...
info:eu-repo/semantics/altIdentifier/doi/10.1063/5.0060429. , 2021
Link:
https://hal.science/hal-03358906
RT Journal T1 <Title>On the minimum thickness of doped Electron/Hole Transport Layers in organic semiconductor devices</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftceafr:oai:HAL:hal-03358906v1&Exemplar=1&LAN=DE A1 Oussalah, D A1 Clerc, R A1 Baylet, J A1 Paquet, R A1 Sésé, C A1 Laugier, C A1 Racine, B A1 Vaillant, J PB HAL CCSD; American Institute of Physics YR 2021 K1 [PHYS]Physics [physics] JF info:eu-repo/semantics/altIdentifier/doi/10.1063/5.0060429 LK http://dx.doi.org/https://hal.science/hal-03358906 DO https://hal.science/hal-03358906 SF ELIB - SuUB Bremen
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