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1 Ergebnisse
1
Microstructural and compositional characteristics of GaN fi..:
Luo XH
;
Wang RM
;
Zhang XP
...
MICRON, 35 (6). , 2004
Link:
http://ir.semi.ac.cn/handle/172111/13599
RT Journal T1
Microstructural and compositional characteristics of GaN films grown on a ZnO-buffered Si(111) wafer
UL https://suche.suub.uni-bremen.de/peid=base-ftchinacadscsemi:oai:ir.semi.ac.cn:172111_13599&Exemplar=1&LAN=DE A1 Luo XH A1 Wang RM A1 Zhang XP A1 Zhang HZ A1 Yu DP A1 Luo MC A1 Wang RM Peking Univ Electron Microscopy Lab Beijing 100871 Peoples R China. 电子邮箱地址: rmwang@pku.edu.cn PB PERGAMON-ELSEVIER SCIENCE LTD YR 2004 K1 Transmission Electron Microscopy K1 Electron Energy Loss Spectroscopy K1 Molecular Beam Epitaxy K1 Gallium Nitride K1 Chemical-vapor-deposition K1 Epitaxy K1 Layer K1 半导体材料 K1 atomic layer deposition K1 chemical vapor deposition K1 vapor-plating K1 tem K1 durchstrahlungs-elektronenmikroskopie K1 microscopie par transmission K1 transmission microscopy K1 tem (microscopy) K1 electron microscopy (transmission) K1 eels (spectrum analysis) K1 energy loss spectroscopy K1 electron K1 spectroscopy K1 electron energy loss K1 atomic layer epitaxial growth K1 ale K1 mle growth K1 molecular layer epitaxial growth K1 chemical beam epitaxial growth K1 cbe K1 gas source mbe K1 gsmbe K1 metalorganic molecular beam epitaxy K1 mombe K1 ommbe K1 chemical vapour deposition K1 apcvd K1 cvd K1 laser cvd K1 laser-induced cvd K1 lpcvd K1 chemical vapour infiltration K1 chemical vapor infiltration K1 cvi K1 crystal growth from vapour JF MICRON, 35 (6) LK http://ir.semi.ac.cn/handle/172111/13599 DO http://ir.semi.ac.cn/handle/172111/13599 SF ELIB - SuUB Bremen
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