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1 Ergebnisse
1
Growth behavior of AlInGaN films:
Shang JZ
;
Zhang BP
;
Mao MH
...
JOURNAL OF CRYSTAL GROWTH. , 2009
Link:
http://ir.semi.ac.cn/handle/172111/7309
RT Journal T1
Growth behavior of AlInGaN films
UL https://suche.suub.uni-bremen.de/peid=base-ftchinacadscsemi:oai:ir.semi.ac.cn:172111_7309&Exemplar=1&LAN=DE A1 Shang JZ A1 Zhang BP A1 Mao MH A1 Cai LE A1 Zhang JY A1 Fang ZL A1 Liu BL A1 Yu JZ A1 Wang QM A1 Kusakabe K A1 Ohkawa K A1 Zhang BP Xiamen Univ Dept Phys Xiamen 361005 Peoples R China. E-mail Address: bzhang@xmu.edu.cn YR 2009 K1 Scanning Electron Microscope K1 Strain K1 X-ray Diffraction K1 Alingan K1 半导体材料 K1 scanning electron microscopes K1 scanning electron microscopy K1 x-ray crystallography K1 microscopes K1 scanning electron K1 sem K1 microscopie electronique par balayage K1 raster-elektronenmikroskopie K1 sem (microscopy) K1 electron microscopy (scanning) K1 scanning transmission electron microscopy K1 应变 K1 deformation sous charge K1 verformung K1 yield strain K1 x射线衍射 K1 x ray diffraction K1 borrmann effect K1 debye-scherrer cameras K1 laue effect K1 patterson diagrams K1 pendellosung fringes K1 radiocrystallography K1 weissenberg cameras K1 xrd K1 diffraction des rayons x K1 roentenbeugung K1 roentgenbeugung K1 x ray crystallography K1 xray diffraction K1 x射线晶体学 K1 x ray diffractometers JF JOURNAL OF CRYSTAL GROWTH LK http://ir.semi.ac.cn/handle/172111/7309 DO http://ir.semi.ac.cn/handle/172111/7309 SF ELIB - SuUB Bremen
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